Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

$155.00
$155.00
$155.00
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Author/Contributor(s): Kumar, Samir ; Pathak, Chandra Shakher
Publisher: Intechopen
Date: 01/07/2022
Binding: Hardcover
Condition: NEW